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Alternative method of interface traps passivation by introducing of thin silicon nitride layer at 4H-SiC/SiO2 interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1693 / 2014
- Published online by Cambridge University Press:
- 26 June 2014, mrss14-1693-dd02-04
- Print publication:
- 2014
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- Article
- Export citation